ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,268, issued on April 21, was assigned to MiTeGen LLC (Ilthaca, N.Y.). "Sample supports for cryo-electron microscopy" was invented by Rober... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,269, issued on April 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system" was invented by Natsuki Tsuno (Tokyo), Yasuh... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,270, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Charged particle microscope for examining a specimen, and method of d... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,271, issued on April 21, was assigned to Advanced Energy Industries Inc. (Denver). "High voltage power supplies for fast voltage changes" ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,272, issued on April 21, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Particle beam system" was invented by Gero Walter (W... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,273, issued on April 21, was assigned to Japan Science and Technology Agency (Saitama, Japan). "Electron microscope, device for measuring ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,274, issued on April 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam device" was invented by Minami Shouji (To... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,275, issued on April 21, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Orientation tool for electron backscatter diffrac... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,276, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Mixed-gas species plasma source system" was invented by David Levi (H... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,277, issued on April 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Method for determining amount of wear of edge ring, plasma processi... Read More